000			01279cam a2200277 a 4500
005			20260112063218.0
010			_a2004-301166
020			_a9780199268016
039			_a202111031627 _bstaff _c201206290209 _d staff _c200907220238 _d staff _c200907220237 _d staff _y 200907220229 _z staff
050			_a330.015195 _bHEI
082			_a330.015195 _bHEI [ Shelf 21 ]
245			_aEconometric methods with applications in business and economics / _cChristiaan Heij ... [et al.].
260			_aOxford ; _aNew York : _bOxford University Press, _c2004.
300			_axxv, 787 p. : _bill. ; _c26 cm.
504			_aIncludes bibliographical references and index.
650			_aEconometrics.
700			_aHeij, C.
856			_Table of contents only _u http://www.loc.gov/catdir/toc/fy045/2004301166.html
856			_Publisher description _u http://www.loc.gov/catdir/enhancements/fy0620/2004301166-d.html
856			_Contributor biographical information _u http://www.loc.gov/catdir/enhancements/fy0726/2004301166-b.html
906			_a7 _bcbc _ccopycat _d 2 _e ncip _f 20 _g y-gencatlg
925			_aacquire _b2 shelf copies _x policy default
991			_aVIRTUA
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909			_a12
999			_c9 _d9